Peripheral circuit inspection
Orbotech's peripheral inspection technology extends the capabilities of its AOI solutions by enabling maximum panel area inspection, and defect...
Value-Added Applications
World’s leading automated inspection solutions
We bring our customers the world’s leading automated inspection solutions to help them achieve the highest quality displays and reduce production costs. Orbotech’s AOI systems are complemented by state-of-the-art value-added applications that are designed to optimize and further extend the capabilities of the inspection process. Together, they detect, process, analyze, measure, compare and classify defects and process parameters, providing our customers with the widest possible range of capabilities to support all their inspection needs.
Macro inspection
The combination of Orbotech's Digital Macro and Advanced Macro Optical System (AMOS) increases the efficiency of the inspection process. This 2-in-1...
Cost-effective real-time process monitoring
Orbotech's automated 2D and 3D metrology solutions enable tight process control, using critical dimension, overlay, height and thickness...
Automatic defect classification - ADC
Orbotech's cutting-edge, Automatic Defect Classification (ADC) is used in the global FPD industry by many panel manufacturers. Automatic Defect...
Support for all advanced pixel designs
With Orbotech’s variable pattern and free form inspection technologies, the AOI solutions can accurately detect defects on any pattern and in any shape,...
