Value-Added Applications

World’s leading automated inspection solutions

We bring our customers the world’s leading automated inspection solutions to help them achieve the highest quality displays and reduce production costs. Orbotech’s AOI systems are complemented by state-of-the-art value-added applications that are designed to optimize and further extend the capabilities of the inspection process. Together, they detect, process, analyze, measure, compare and classify defects and process parameters, providing our customers with the widest possible range of capabilities to support all their inspection needs.

Peripheral Inspection

Peripheral Inspection

Orbotech's peripheral...

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Macro Inspection

Macro Inspection

The combination of Orbotech's Digital Macro and Advanced Macro...

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Metrology

Metrology

Orbotech's automated 2D and 3D metrology solutions enable tight process control, using critical...

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Defect Classification - ADC

Defect Classification - ADC

Orbotech's cutting-edge, Automatic Defect Classification...

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Support for all advanced pixel designs

Support for all advanced pixel designs

With Orbotech’s variable pattern and free form inspection technologies, the AOI solutions can accurately detect defects on any pattern...

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