Peripheral Inspection
Extends the capabilities of Orbotech’s AOI solutions by enabling a maximum panel area inspection
Orbotech's peripheral inspection technology extends the capabilities of its AOI solutions by enabling maximum panel area inspection, and defect detection in the peripheral circuit areas. Manufacturers can inspect for flaws in driver circuitry, pad areas and other integrated electronics. By leveraging our dedicated algorithms together with an advanced GUI, Orbotech’s peripheral inspection provides comprehensive yield management to almost 100% of any panel area.
Highlights:
- Inspection of the entire active area of the glass with no additional cycle time (TACT)
- Fast and easy setup
- Automatic pattern recognition and algorithm comparison
Benefits:
- Improves total yield
- Provides comprehensive detection of electronic circuits across the entire glass
- Reduces the need for additional and timely electrical testing
- Simplified and fast system setup and operation
